Modification of the AFM Sensor by a Precisely Regulated Air Stream to Increase Imaging Speed and Accuracy in the Contact Mode

Increasing the imaging rate of atomic force microscopy (AFM) without impairing of the imaging quality is a challenging task, since the increase in the scanning speed leads to a number of artifacts related to the limited mechanical bandwidth of the AFM components. One of these artifacts is the loss o...

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Bibliographic Details
Main Authors: Andrius Dzedzickis, Vytautas Bucinskas, Darius Viržonis, Nikolaj Sesok, Arturas Ulcinas, Igor Iljin, Ernestas Sutinys, Sigitas Petkevicius, Justinas Gargasas, Inga Morkvenaite-Vilkonciene
Format: Article
Language:English
Published: MDPI AG 2018-08-01
Series:Sensors
Subjects:
Online Access:http://www.mdpi.com/1424-8220/18/8/2694