Modification of the AFM Sensor by a Precisely Regulated Air Stream to Increase Imaging Speed and Accuracy in the Contact Mode
Increasing the imaging rate of atomic force microscopy (AFM) without impairing of the imaging quality is a challenging task, since the increase in the scanning speed leads to a number of artifacts related to the limited mechanical bandwidth of the AFM components. One of these artifacts is the loss o...
Main Authors: | Andrius Dzedzickis, Vytautas Bucinskas, Darius Viržonis, Nikolaj Sesok, Arturas Ulcinas, Igor Iljin, Ernestas Sutinys, Sigitas Petkevicius, Justinas Gargasas, Inga Morkvenaite-Vilkonciene |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2018-08-01
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Series: | Sensors |
Subjects: | |
Online Access: | http://www.mdpi.com/1424-8220/18/8/2694 |
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