Seebeck Coefficient of SOI Layer Induced by Phonon Transport
The Seebeck coefficient of a patterned Si wire on P-doped SOI (Si-on-insulator) layer with a carrier concentration of 1018 cm-3 was measured near room temperature. The Seebeck coefficient is found to be smaller than that in the SOI layer and to be closer to the calculated Seebeck coefficient includi...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
Universitas Indonesia
2015-04-01
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Series: | Makara Journal of Technology |
Subjects: | |
Online Access: | http://journal.ui.ac.id/technology/journal/article/view/3022 |