Direct Least Absolute Deviation Fitting of Ellipses

Scattered data from edge detection usually involve undesired noise which seriously affects the accuracy of ellipse fitting. In order to alleviate this kind of degradation, a method of direct least absolute deviation ellipse fitting by minimizing the ℓ1 algebraic distance is presented. Unlike the con...

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Bibliographic Details
Main Authors: Gang Zhou, Kai Zhong, Zhongwei Li, Yusheng Shi
Format: Article
Language:English
Published: Hindawi Limited 2020-01-01
Series:Mathematical Problems in Engineering
Online Access:http://dx.doi.org/10.1155/2020/1317349