Optical excitation of atomic force microscopy cantilever for accurate spectroscopic measurements
Abstract Reliable operation of frequency modulation mode atomic force microscopy (FM-AFM) depends on a clean resonance of an AFM cantilever. It is recognized that the spurious mechanical resonances which originate from various mechanical components in the microscope body are excited by a piezoelectr...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2020-02-01
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| Series: | EPJ Techniques and Instrumentation |
| Subjects: | |
| Online Access: | https://doi.org/10.1140/epjti/s40485-020-0053-9 |