Simplified Estimation of Junction Temperature Fluctuation at the Fundamental Frequency for IGBT Modules Considering Mission Profile
The junction temperature at the fundamental frequency cannot be ignored in a lifetime evaluation of insulated-gate bipolar transistors (IGBTs) with a long-term mission profile. Therefore, it is very important in terms of calculation speed and accuracy to simplify the loss curve when calculating the...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8868176/ |