A novel method to remove impulse noise from atomic force microscopy images based on Bayesian compressed sensing
A novel method based on Bayesian compressed sensing is proposed to remove impulse noise from atomic force microscopy (AFM) images. The image denoising problem is transformed into a compressed sensing imaging problem of the AFM. First, two different ways, including interval approach and self-comparis...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Beilstein-Institut
2019-11-01
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| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.10.225 |