Confronting the Variability Issues Affecting the Performance of Next-Generation SRAM Design to Optimize and Predict the Speed and Yield
Effectively confronting device and circuit parameter variations to maintain or improve the design of high performance and energy efficient systems while satisfying historical standards for reliability and lower costs is increasingly challenging with the scaling of technology. In this paper, we devel...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2014-01-01
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| Series: | IEEE Access |
| Online Access: | https://ieeexplore.ieee.org/document/6815646/ |