Improvement of Alternative Non-Raster Scanning Methods for High Speed Atomic Force Microscopy: A Review
The invention of the nanotechnology adds a new branch to investigate and control the physical properties of matters at atomic level. The aim of this technology is to image the characteristics of metals, biological organs, and polymers. Scanning probe microscopy (SPM) opens a new branch to analysis t...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8809367/ |