ANALYSIS OF DATA SKIPPING USING LOW TRANSITION SWITCH REGISTERS
The emerging scenario in the fields of VLSI testing has its own demand for fault diagnosis in VLSI circuits. If the area and size of the circuit increases the problem of test generation time becoming very tough. Efficient techniques for test generations are essential in order to reduce the test...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
ICT Academy of Tamil Nadu
2020-01-01
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| Series: | ICTACT Journal on Microelectronics |
| Subjects: | |
| Online Access: | http://ictactjournals.in/paper/IJME_Vol_5_Iss_4_Paper_2_850_853.pdf |