Correcting Susceptibility Artifacts of MRI Sensors in Brain Scanning: A 3D Anatomy-Guided Deep Learning Approach

Correcting Susceptibility Artifacts of MRI Sensors in Brain Scanning: A 3D Anatomy-Guided Deep Learning Approach

Echo planar imaging (EPI), a fast magnetic resonance imaging technique, is a powerful tool in functional neuroimaging studies. However, susceptibility artifacts, which cause misinterpretations of brain functions, are unavoidable distortions in EPI. This paper proposes an end-to-end deep learning fra...

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Bibliographic Details
Main Authors: Soan T. M. Duong, Son Lam Phung, Abdesselam Bouzerdoum, Sui Paul Ang, Mark M. Schira
Format: Article
Language:English
Published: MDPI AG 2021-03-01
Series:Sensors
Subjects:
susceptibility artifacts
deep learning
high-speed
echo planar imaging
reversed phase-encoding
Online Access:https://www.mdpi.com/1424-8220/21/7/2314

Internet

https://www.mdpi.com/1424-8220/21/7/2314

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