Color Shift Modeling of Light-Emitting Diode Lamps in Step-Loaded Stress Testing

Color Shift Modeling of Light-Emitting Diode Lamps in Step-Loaded Stress Testing

The color coordinate shift of light-emitting diode (LED) lamps is investigated by running three stress-loaded testing methods, namely step-up stress accelerated degradation testing, step-down stress accelerated degradation testing, and constant stress accelerated degradation testing. A power model i...

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Bibliographic Details
Main Authors: Miao Cai, Daoguo Yang, Jianlin Huang, Maofen Zhang, Xianping Chen, Caihang Liang, Sau Koh, Guoqi Zhang
Format: Article
Language:English
Published: IEEE 2017-01-01
Series:IEEE Photonics Journal
Subjects:
Light-emitting diodes (LEDs)
color shift (CS)
reliability modeling
degradation mechanism
Online Access:https://ieeexplore.ieee.org/document/7765031/

Internet

https://ieeexplore.ieee.org/document/7765031/

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