Metric Learning-Based Multi-Instance Multi-Label Classification With Label Correlation

In multi-instance multi-label learning (MIML) problems, predicting the labels of unseen bags becomes difficult when the labels of their instances are not provided directly. Therefore, it is necessary to exploit the label correlations to enhance the accuracy of the MIML classification. This paper pre...

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Bibliographic Details
Main Authors: Haifeng Hu, Zhikai Cui, Jiansheng Wu, Kun Wang
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8759859/