High Pressure X-ray Diffraction as a Tool for Designing Doped Ceria Thin Films Electrolytes

High Pressure X-ray Diffraction as a Tool for Designing Doped Ceria Thin Films Electrolytes

Rare earth-doped ceria thin films are currently thoroughly studied to be used in miniaturized solid oxide cells, memristive devices and gas sensors. The employment in such different application fields derives from the most remarkable property of this material, namely ionic conductivity, occurring th...

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Bibliographic Details
Main Authors: Sara Massardo, Alessandro Cingolani, Cristina Artini
Format: Article
Language:English
Published: MDPI AG 2021-06-01
Series:Coatings
Subjects:
ionic conductivity
defects association
high pressure X-ray diffraction
doped ceria
thin films
microdevices
Online Access:https://www.mdpi.com/2079-6412/11/6/724

Internet

https://www.mdpi.com/2079-6412/11/6/724

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