Research Update: Spatially resolved mapping of electronic structure on atomic level by multivariate statistical analysis

Research Update: Spatially resolved mapping of electronic structure on atomic level by multivariate statistical analysis

Atomic level spatial variability of electronic structure in Fe-based superconductor FeTe0.55Se0.45 (Tc = 15 K) is explored using current-imaging tunneling-spectroscopy. Multivariate statistical analysis of the data differentiates regions of dissimilar electronic behavior that can be ide...

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Bibliographic Details
Main Authors: Alex Belianinov, Panchapakesan Ganesh, Wenzhi Lin, Brian C. Sales, Athena S. Sefat, Stephen Jesse, Minghu Pan, Sergei V. Kalinin
Format: Article
Language:English
Published: AIP Publishing LLC 2014-12-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/1.4902996

Internet

http://dx.doi.org/10.1063/1.4902996

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