Measurement of the optical dielectric properties of thin-film materials by ultrafast time-resolved interferometry
We report a time-resolved optic interferometry (TROI) that enables to straightway probe the optical properties of traditional and special thin-film materials by feat of a phase delayed-interference between double beams of femtosecond laser synchronously traveling through vacuum (air) and sample, res...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2020-03-01
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| Series: | Results in Physics |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2211379719337672 |