NCFET-Based 6-T SRAM: Yield Estimation Based on Variation-Aware Sensitivity
The key feature of NCFET (negative capacitance field effect transistor) is its sub-threshold slope (SS) <; 60 mV/decade at 300 K. In this work, the n-type NCFET (i.e., pull-down (PD) and passgate (PG) transistor in six-transistor (6T) SRAM bit-cell) has SS of 53.92 mV/decade, and the p-type N...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8999594/ |