CMOS Image Sensor Random Telegraph Noise Time Constant Extraction From Correlated To Uncorrelated Double Sampling

CMOS Image Sensor Random Telegraph Noise Time Constant Extraction From Correlated To Uncorrelated Double Sampling

A new method for on-chip random telegraph noise (RTN) characteristic time constant extraction using the double sampling circuit in an 8.3 Mpixel CMOS image sensor is described. The dependence of the measured RTN on the time difference between the double sampling and the key equation used for time co...

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Bibliographic Details
Main Authors: Calvin Yi-Ping Chao, Honyih Tu, Thomas Wu, Kuo-Yu Chou, Shang-Fu Yeh, Fu-Lung Hsueh
Format: Article
Language:English
Published: IEEE 2017-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Random telegraph noise (RTN)
CMOS image sensor (CIS)
correlated double sampling (CDS)
Online Access:https://ieeexplore.ieee.org/document/7731134/

Internet

https://ieeexplore.ieee.org/document/7731134/

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