Growth and Correlation of the Physical and Structural Properties of Hexagonal Nanocrystalline Nickel Oxide Thin Films with Film Thickness

Growth and Correlation of the Physical and Structural Properties of Hexagonal Nanocrystalline Nickel Oxide Thin Films with Film Thickness

This study investigated nonstoichiometric nickel oxide thin films prepared via the DC-sputtering technique at different film thicknesses. The prepared films were characterized by a surface profiler for thickness measurement, X-ray diffraction (XRD) for film nature, atomic force microscopy (AFM) for...

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Bibliographic Details
Main Authors: Ahmed H. Hammad, Mohamed Sh. Abdel-wahab, Sajith Vattamkandathil, Akhalakur Rahman Ansari
Format: Article
Language:English
Published: MDPI AG 2019-09-01
Series:Coatings
Subjects:
sputtered nickel oxide
x-ray diffraction
morphology
optical band gap
refractive index
dielectric constant
Online Access:https://www.mdpi.com/2079-6412/9/10/615

Internet

https://www.mdpi.com/2079-6412/9/10/615

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