Growth and Correlation of the Physical and Structural Properties of Hexagonal Nanocrystalline Nickel Oxide Thin Films with Film Thickness
This study investigated nonstoichiometric nickel oxide thin films prepared via the DC-sputtering technique at different film thicknesses. The prepared films were characterized by a surface profiler for thickness measurement, X-ray diffraction (XRD) for film nature, atomic force microscopy (AFM) for...
Main Authors: | Ahmed H. Hammad, Mohamed Sh. Abdel-wahab, Sajith Vattamkandathil, Akhalakur Rahman Ansari |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2019-09-01
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Series: | Coatings |
Subjects: | |
Online Access: | https://www.mdpi.com/2079-6412/9/10/615 |
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