Control chart limits based on true process capability with consideration of measurement system error
Shewhart X̅ and R control charts and process capability indices, proven to be effective tools in statistical process control are widely used under the assumption that the measurement system is free from errors. However, measurement variability is unavoidable and may be evaluated by the measurement s...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2016-01-01
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| Series: | International Journal of Metrology and Quality Engineering |
| Subjects: | |
| Online Access: | https://doi.org/10.1051/ijmqe/2016021 |