Measurement of the Indentation Modulus and the Local Internal Friction in Amorphous SiO2 Using Atomic Force Acoustic Microscopy

Measurement of the Indentation Modulus and the Local Internal Friction in Amorphous SiO2 Using Atomic Force Acoustic Microscopy

For the past two decades, atomic force acoustic microscopy (AFAM), an advanced scanning probe microscopy technique, has played a promising role in materials characterization with a good lateral resolution at micro/nano dimensions. AFAM is based on inducing out-of-plane vibrations in the specimen, wh...

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Bibliographic Details
Main Authors: Zhang B., Wagner H., Büchsenschütz-Göbeler M., Luo Y., Küchemann S., Arnold W., Samwer K.
Format: Article
Language:English
Published: Polish Academy of Sciences 2016-03-01
Series:Archives of Metallurgy and Materials
Subjects:
Amorphous materials
potential energy landscape
internal friction
atomic force acoustic microscopy
Online Access:http://www.degruyter.com/view/j/amm.2016.61.issue-1/amm-2016-0006/amm-2016-0006.xml?format=INT

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http://www.degruyter.com/view/j/amm.2016.61.issue-1/amm-2016-0006/amm-2016-0006.xml?format=INT

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