Artificial Magnetic Pattern Arrays Probed by Polarized Neutron Reflectivity

Artificial Magnetic Pattern Arrays Probed by Polarized Neutron Reflectivity

Traditionally, neutron scattering is an essential method for the analysis of spin structures and spin excitations in bulk materials. Over the last 30 years, polarized neutron scattering in terms of reflectometry has also contributed largely to the analysis of magnetic thin films and magnetic multila...

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Bibliographic Details
Main Authors: Dmitry Gorkov, Boris P. Toperverg, Hartmut Zabel
Format: Article
Language:English
Published: MDPI AG 2020-04-01
Series:Nanomaterials
Subjects:
neutron reflectometry
magnetic nanostructures
magnetic multilayers
polarization analysis
coherence volume
Online Access:https://www.mdpi.com/2079-4991/10/5/851

Internet

https://www.mdpi.com/2079-4991/10/5/851

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