Mapping cation diffusion through lattice defects in epitaxial oxide thin films on the water-soluble buffer layer Sr3Al2O6 using atomic resolution electron microscopy
Recent advances in the synthesis of oxide thin films have led to the discovery of novel functionalities that are not accessible in bulk structures. However, their physical properties are vulnerable to the presence of crystal defects, which can give rise to structural, chemical, and electronic modifi...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2017-09-01
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| Series: | APL Materials |
| Online Access: | http://dx.doi.org/10.1063/1.4994538 |