Application of electron crystallography to structure characterization of ZnS nanocrystals

We chracterized the structure properties of two types of ZnS nanocrystals by electron crystallography. X-ray diffraction analysis for these ZnS nanocrystals was performed to determine their initial structures. Their crystallite sizes were about 5.9 nm and 8.1 nm and their crystal systems were hexago...

Full description

Bibliographic Details
Main Authors: Jin-Gyu Kim, Sang-Gil Lee, Hyun-Min Park, Youn-Joong Kim
Format: Article
Language:English
Published: SpringerOpen 2011-07-01
Series:Journal of Analytical Science and Technology
Subjects:
ZnS
Online Access:http://www.jastmag.org/journal/view.php?Type=C&number=36