A Novel Nanoscale FDSOI MOSFET with Block-Oxide

We demonstrate improved device performance by applying oxide sidewall spacer technology to a block-oxide-enclosed Si body to create a fully depleted silicon-on-insulator (FDSOI) nMOSFET, which overcomes the need for a uniform ultrathin silicon film. The presence of block-oxide along the sidewalls of...

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Bibliographic Details
Main Authors: Jyi-Tsong Lin, Yi-Chuen Eng, Po-Hsieh Lin
Format: Article
Language:English
Published: Hindawi Limited 2013-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/2013/627873