Determination of microrelief of the sample by singular beams superposition
In present paper we propose easy way to implement method of interfering vortices with opposite topological charge for the real time determination of the thickness and information about the surface of studied samples with the resolution up to 7 nanometers. The determination of the characteristics of...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Samara National Research University
2019-10-01
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| Series: | Компьютерная оптика |
| Subjects: | |
| Online Access: | http://computeroptics.ru/KO/PDF/KO43-5/430505.pdf |