Static Power SCA of Sub-100 nm CMOS ASICs and the Insecurity of Masking Schemes in Low-Noise Environments
Semiconductor technology scaling faced tough engineering challenges while moving towards and beyond the deep sub-micron range. One of the most demanding issues, limiting the shrinkage process until the present day, is the difficulty to control the leakage currents in nanometer-scaled field-effect t...
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| Format: | Article |
| Language: | English |
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Ruhr-Universität Bochum
2019-05-01
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| Series: | Transactions on Cryptographic Hardware and Embedded Systems |
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| Online Access: | https://tches.iacr.org/index.php/TCHES/article/view/8294 |