Nanoscale Ferroelectric Characterization with Heterodyne Megasonic Piezoresponse Force Microscopy

Abstract Piezoresponse force microscopy (PFM), as a powerful nanoscale characterization technique, has been extensively utilized to elucidate diverse underlying physics of ferroelectricity. However, intensive studies of conventional PFM have revealed a growing number of concerns and limitations whic...

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Bibliographic Details
Main Authors: Qibin Zeng, Hongli Wang, Zhuang Xiong, Qicheng Huang, Wanheng Lu, Kuan Sun, Zhen Fan, Kaiyang Zeng
Format: Article
Language:English
Published: Wiley 2021-04-01
Series:Advanced Science
Subjects:
Online Access:https://doi.org/10.1002/advs.202003993