High-Throughput Measurement of the Contact Resistance of Metal Electrode Materials and Uncertainty Estimation

Low and stable contact resistance of metal electrode materials is mainly demanded for reliable and long lifetime electrical engineering. A novel test rig is developed in order to realize the high-throughput measurement of the contact resistance with the adjustable mechanical load force and load curr...

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Bibliographic Details
Main Authors: Chao Zhang, Wanbin Ren
Format: Article
Language:English
Published: MDPI AG 2020-12-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/9/12/2079