Fully Coupled Electrothermal Simulation of Large RRAM Arrays in the “Thermal-House”

Fully Coupled Electrothermal Simulation of Large RRAM Arrays in the “Thermal-House”

Thermal crosstalk in a highly integrated RRAM array due to the self-heating effect is one of the most critical issues affecting device reliability. In this paper, two types of “thermal-house” structures are proposed to optimize the thermal management of the RRAM array. An in-ho...

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Bibliographic Details
Main Authors: Da-Wei Wang, Wenchao Chen, Wen-Sheng Zhao, Guo-Dong Zhu, Kai Kang, Pingqi Gao, Jose E. Schutt-Aine, Wen-Yan Yin
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Electrothermal simulation
low power consumption
parallel simulator
resistive-switching random access memory (RRAM)
thermal-house
thermal management
Online Access:https://ieeexplore.ieee.org/document/8580571/

Internet

https://ieeexplore.ieee.org/document/8580571/

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