Characterization of a Pixelated Cadmium Telluride Detector System Using a Polychromatic X-Ray Source and Gold Nanoparticle-Loaded Phantoms for Benchtop X-Ray Fluorescence Imaging

Characterization of a Pixelated Cadmium Telluride Detector System Using a Polychromatic X-Ray Source and Gold Nanoparticle-Loaded Phantoms for Benchtop X-Ray Fluorescence Imaging

Pixelated semi-conductor detectors providing high energy resolution enable parallel acquisition of x-ray fluorescence (XRF) signals, potentially leading to performance enhancement of benchtop XRF imaging or computed tomography (XFCT) systems utilizing ordinary polychromatic x-ray sources. However, l...

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Bibliographic Details
Main Authors: Sandun Jayarathna, Md Foiez Ahmed, Liam O'ryan, Hem Moktan, Yonggang Cui, Sang Hyun Cho
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Pixelated CdTe detector
HEXITEC
x-ray fluorescence
benchtop x-ray fluorescence computed tomography
gold nanoparticles
Online Access:https://ieeexplore.ieee.org/document/9388666/

Internet

https://ieeexplore.ieee.org/document/9388666/

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