X-Sand Filter: An X-Tolerant Response Compaction Technique for Faster-Than-At-Speed Testing

Faster-than-at-speed testing provides an effective way of detecting small delay defects but at the cost of increased number of unknown logic values on longer paths of the circuit under test. For efficient testing, these unknown logic values need to be filtered out of the circuit under test output. I...

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Bibliographic Details
Main Authors: Salman Ahmad, Kashif Iqbal
Format: Article
Language:English
Published: Mehran University of Engineering and Technology 2020-04-01
Series:Mehran University Research Journal of Engineering and Technology
Online Access:https://publications.muet.edu.pk/index.php/muetrj/article/view/1594