Possibilities for serial femtosecond crystallography sample delivery at future light sources
Serial femtosecond crystallography (SFX) uses X-ray pulses from free-electron laser (FEL) sources that can outrun radiation damage and thereby overcome long-standing limits in the structure determination of macromolecular crystals. Intense X-ray FEL pulses of sufficiently short duration allow the co...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC and ACA
2015-07-01
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| Series: | Structural Dynamics |
| Online Access: | http://dx.doi.org/10.1063/1.4921220 |