Possibilities for serial femtosecond crystallography sample delivery at future light sources

Serial femtosecond crystallography (SFX) uses X-ray pulses from free-electron laser (FEL) sources that can outrun radiation damage and thereby overcome long-standing limits in the structure determination of macromolecular crystals. Intense X-ray FEL pulses of sufficiently short duration allow the co...

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Bibliographic Details
Main Authors: L. M. G. Chavas, L. Gumprecht, H. N. Chapman
Format: Article
Language:English
Published: AIP Publishing LLC and ACA 2015-07-01
Series:Structural Dynamics
Online Access:http://dx.doi.org/10.1063/1.4921220

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