A Defect Detection Method for the Image With Intersecting Feature
Since the intersecting feature between the defect and the background of the image, the defect detection often results in under-segmentation or over-segmentation. To solve this problem, we propose a new defect extraction method by calculating the maximum mutual information of intersecting features. F...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9090137/ |