Optical Characterization of As<sub>x</sub>Te<sub>100−x </sub>Films Grown by Plasma Deposition Based on the Advanced Optimizing Envelope Method

Optical Characterization of As<sub>x</sub>Te<sub>100−x </sub>Films Grown by Plasma Deposition Based on the Advanced Optimizing Envelope Method

Three As<sub>x</sub>Te<sub>100−x</sub> films with different x and dissimilar average thickness are characterized mainly from one interference transmittance spectrum <i>T</i>(<i>λ </i>= 300 to 3000 nm) of such film on a substrate based on the advanced o...

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Bibliographic Details
Main Authors: Dorian Minkov, George Angelov, Radi Nestorov, Aleksey Nezhdanov, Dmitry Usanov, Mikhail Kudryashov, Aleksandr Mashin
Format: Article
Language:English
Published: MDPI AG 2020-07-01
Series:Materials
Subjects:
advanced optimizing envelope method
optical characterization
superior accuracy
As<sub>x</sub>Te<sub>100−x</sub> films
light scattering
partial coherence
Online Access:https://www.mdpi.com/1996-1944/13/13/2981

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https://www.mdpi.com/1996-1944/13/13/2981

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