Temperature-Dependent Carrier Recombination and Efficiency Droop of AlGaN Deep Ultraviolet Light-Emitting Diodes

Temperature-Dependent Carrier Recombination and Efficiency Droop of AlGaN Deep Ultraviolet Light-Emitting Diodes

We investigate temperature-dependent carrier transfer and efficiency droop on AlGaN-based deep ultraviolet light-emitting diodes. The Shockley-Read-Hall (SRH) recombination and carrier leakage are highly associated with the poor thermal stability. The existence of Auger recombination and carrier lea...

Full description

Bibliographic Details
Main Authors: Zhangbao Peng, Weijie Guo, Tingzhu Wu, Ziquan Guo, Yijun Lu, Yicheng Zheng, Yue Lin, Zhong Chen
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Photonics Journal
Subjects:
Deep ultraviolet light-emitting diodes
recombination mechanisms
efficiency droop
<inline-formula xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"> <tex-math notation="LaTeX">${ABC}$</tex-math> </inline-formula> model.
Online Access:https://ieeexplore.ieee.org/document/8928508/

Internet

https://ieeexplore.ieee.org/document/8928508/

Similar Items