THE GOODNESS OF SIMULTANEOUS FITS IN ISIS

THE GOODNESS OF SIMULTANEOUS FITS IN ISIS

In a previous work, we introduced a tool for analyzing multiple datasets simultaneously, which has been implemented into ISIS. This tool was used to fit many spectra of X-ray binaries. However, the large number of degrees of freedom and individual datasets raise an issue about a good measure for a s...

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Bibliographic Details
Main Authors: Matthias Kühnel, Sebastian Falkner, Christoph Grossberger, Ralf Ballhausen, Thomas Dauser, Fritz-Walter Schwarm, Ingo Kreykenbohm, Michael A. Nowak, Katja Pottschmidt, Carlo Ferrigno, Richard E. Rothschild, Silvia Martínez-Núñez, José Miguel Torrejón, Felix Fürst, Dmitry Klochkov, Rüdiger Staubert, Peter Kretschmar, Jörn Wilms
Format: Article
Language:English
Published: CTU Central Library 2016-02-01
Series:Acta Polytechnica
Subjects:
Methods: data analysis
X-rays: binaries
Online Access:https://ojs.cvut.cz/ojs/index.php/ap/article/view/3047

Internet

https://ojs.cvut.cz/ojs/index.php/ap/article/view/3047

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