Improving the precision of optical metrology by detecting fewer photons with biased weak measurement

Improving the precision of optical metrology by detecting fewer photons with biased weak measurement

Abstract In optical metrological protocols to measure physical quantities, it is, in principle, always beneficial to increase photon number n to improve measurement precision. However, practical constraints prevent the arbitrary increase of n due to the imperfections of a practical detector, especia...

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Bibliographic Details
Main Authors: Peng Yin, Wen-Hao Zhang, Liang Xu, Ze-Gang Liu, Wei-Feng Zhuang, Lei Chen, Ming Gong, Yu Ma, Xing-Xiang Peng, Gong-Chu Li, Jin-Shi Xu, Zong-Quan Zhou, Lijian Zhang, Geng Chen, Chuan-Feng Li, Guang-Can Guo
Format: Article
Language:English
Published: Nature Publishing Group 2021-05-01
Series:Light: Science & Applications
Online Access:https://doi.org/10.1038/s41377-021-00543-4

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