Nonparametric Hierarchical Bayesian Models for Positive Data Clustering Based on Inverted Dirichlet-Based Distributions

In this paper, we propose nonparametric hierarchical Bayesian models based on two inverted Dirichlet-based distributions and Pitman-Yor process for positive data features clustering. The choice of the inverted Dirichlet and the generalized inverted Dirichlet distributions is motivated by their flexi...

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Bibliographic Details
Main Authors: Wentao Fan, Nizar Bouguila
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8744523/