Show Auto-Adaptive and Tell: Learned From the SEM Image Challenge
Scanning electron microscopy (SEM) has been widely used in optical material science. However, a considerable quantity of human resources is required to analyze and describe SEM images. In recent years, the application of computer technology in material science and engineering developed endlessly. Co...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9383261/ |