Massively parallel cantilever-free atomic force microscopy

Atomic force microscopy (AFM) provides high resolution, but is limited to small areas. Here, the authors introduce a massively parallel AFM approach with >1000 probes in a cantilever-free probe architecture, and present an optical method for detecting probe–sample contact with sub-10 nm vertical...

Full description

Bibliographic Details
Main Authors:	Wenhan Cao, Nourin Alsharif, Zhongjie Huang, Alice E. White, YuHuang Wang, Keith A. Brown
Format:	Article
Language:	English
Published:	Nature Publishing Group 2021-01-01
Series:	Nature Communications
Online Access:	https://doi.org/10.1038/s41467-020-20612-3

id	doaj-bccd72b3b038477b86a10cffc2921a7f
record_format	Article
spelling	doaj-bccd72b3b038477b86a10cffc2921a7f2021-01-17T12:13:43ZengNature Publishing GroupNature Communications2041-17232021-01-011211710.1038/s41467-020-20612-3Massively parallel cantilever-free atomic force microscopyWenhan Cao0Nourin Alsharif1Zhongjie Huang2Alice E. White3YuHuang Wang4Keith A. Brown5Department of Mechanical Engineering, Boston UniversityDepartment of Mechanical Engineering, Boston UniversityDepartment of Chemistry and Biochemistry, University of MarylandDepartment of Mechanical Engineering, Boston UniversityDepartment of Chemistry and Biochemistry, University of MarylandDepartment of Mechanical Engineering, Boston UniversityAtomic force microscopy (AFM) provides high resolution, but is limited to small areas. Here, the authors introduce a massively parallel AFM approach with >1000 probes in a cantilever-free probe architecture, and present an optical method for detecting probe–sample contact with sub-10 nm vertical precision.https://doi.org/10.1038/s41467-020-20612-3
collection	DOAJ
language	English
format	Article
sources	DOAJ
author	Wenhan Cao Nourin Alsharif Zhongjie Huang Alice E. White YuHuang Wang Keith A. Brown
spellingShingle	Wenhan Cao Nourin Alsharif Zhongjie Huang Alice E. White YuHuang Wang Keith A. Brown Massively parallel cantilever-free atomic force microscopy Nature Communications
author_facet	Wenhan Cao Nourin Alsharif Zhongjie Huang Alice E. White YuHuang Wang Keith A. Brown
author_sort	Wenhan Cao
title	Massively parallel cantilever-free atomic force microscopy
title_short	Massively parallel cantilever-free atomic force microscopy
title_full	Massively parallel cantilever-free atomic force microscopy
title_fullStr	Massively parallel cantilever-free atomic force microscopy
title_full_unstemmed	Massively parallel cantilever-free atomic force microscopy
title_sort	massively parallel cantilever-free atomic force microscopy
publisher	Nature Publishing Group
series	Nature Communications
issn	2041-1723
publishDate	2021-01-01
description	Atomic force microscopy (AFM) provides high resolution, but is limited to small areas. Here, the authors introduce a massively parallel AFM approach with >1000 probes in a cantilever-free probe architecture, and present an optical method for detecting probe–sample contact with sub-10 nm vertical precision.
url	https://doi.org/10.1038/s41467-020-20612-3
work_keys_str_mv	AT wenhancao massivelyparallelcantileverfreeatomicforcemicroscopy AT nourinalsharif massivelyparallelcantileverfreeatomicforcemicroscopy AT zhongjiehuang massivelyparallelcantileverfreeatomicforcemicroscopy AT aliceewhite massivelyparallelcantileverfreeatomicforcemicroscopy AT yuhuangwang massivelyparallelcantileverfreeatomicforcemicroscopy AT keithabrown massivelyparallelcantileverfreeatomicforcemicroscopy
_version_	1714942626655895552

Massively parallel cantilever-free atomic force microscopy

Similar Items