Fermi-Level Pinning Mechanism in MoS<sub>2</sub> Field-Effect Transistors Developed by Thermionic Emission Theory

Molybdenum disulfide (MoS<sub>2</sub>) field-effect transistors (FETs) with four different source and drain metallic electrodes (Au, Ag, Al, Cu) were fabricated by mechanical exfoliation and vacuum evaporation methods. The mobility of the devices was (Au) 21.01, (Ag) 23.15, (Al) 5.35 and...

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Bibliographic Details
Main Authors: Yu Zhang, Xiong Chen, Hao Zhang, Xicheng Wei, Xiangfeng Guan, Yonghua Wu, Shaozu Hu, Jiale Zheng, Guidong Wang, Jiawen Qiu, Jun Wang
Format: Article
Language:English
Published: MDPI AG 2020-04-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/10/8/2754