Combining Genetic Analysis and Multivariate Modeling to Evaluate Spectral Reflectance Indices as Indirect Selection Tools in Wheat Breeding under Water Deficit Stress Conditions

Combining Genetic Analysis and Multivariate Modeling to Evaluate Spectral Reflectance Indices as Indirect Selection Tools in Wheat Breeding under Water Deficit Stress Conditions

Progress in high-throughput tools has enabled plant breeders to increase the rate of genetic gain through multidimensional assessment of previously intractable traits in a fast and nondestructive manner. This study investigates the potential use of spectral reflectance indices (SRIs; 15 vegetation-S...

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Bibliographic Details
Main Authors: Salah El-Hendawy, Nasser Al-Suhaibani, Ibrahim Al-Ashkar, Majed Alotaibi, Muhammad Usman Tahir, Talaat Solieman, Wael M. Hassan
Format: Article
Language:English
Published: MDPI AG 2020-05-01
Series:Remote Sensing
Subjects:
leaf area index
partial least squares regression
phenomics
phenotyping
recombinant inbred lines
spectroradiometer
Online Access:https://www.mdpi.com/2072-4292/12/9/1480

Internet

https://www.mdpi.com/2072-4292/12/9/1480

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