An optimized harmonic probe with tailored resonant mode for multifrequency atomic force microscopy
For simultaneously measuring specimen’s surface morphology and material properties, multifrequency atomic force microscopy is often employed. In this kind of atomic force microscopy, if the probe’s higher-order resonance frequencies match the integer multiples of its fundamental frequency, the probe...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
SAGE Publishing
2018-11-01
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| Series: | Advances in Mechanical Engineering |
| Online Access: | https://doi.org/10.1177/1687814018811200 |