Fine Mapping of the Wheat Leaf Rust Resistance Gene LrLC10 (Lr13) and Validation of Its Co-segregation Markers

Fine Mapping of the Wheat Leaf Rust Resistance Gene LrLC10 (Lr13) and Validation of Its Co-segregation Markers

Wheat leaf rust, caused by the fungus Puccinia triticina Eriks. (Pt), is a destructive disease found throughout common wheat production areas worldwide. At its adult stage, wheat cultivar Liaochun10 is resistant to leaf rust and the gene for that resistance has been mapped on chromosome 2BS. It was...

Full description

Bibliographic Details
Main Authors: Lina Qiu, Huifang Wang, Yinghui Li, Weidong Wang, Yujia Liu, Junyi Mu, Miaomiao Geng, Weilong Guo, Zhaorong Hu, Jun Ma, Qixin Sun, Chaojie Xie
Format: Article
Language:English
Published: Frontiers Media S.A. 2020-05-01
Series:Frontiers in Plant Science
Subjects:
wheat
LrLC10 (Lr13)
leaf rust resistance
fine mapping
marker-assisted selection (MAS)
Online Access:https://www.frontiersin.org/article/10.3389/fpls.2020.00470/full

Internet

https://www.frontiersin.org/article/10.3389/fpls.2020.00470/full

Similar Items