Multichannel Online Lifetime Accelerating and Testing System for Power Light-Emitting Diodes
The accelerated life testing is a common tool to achieve lifetime prediction and reliability analysis for light-emitting diodes (LEDs). Currently, all popular accelerated methods, either offline or online, employ a large volume, energy-consuming temperature chamber, which will cause the instruments...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2017-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/7894192/ |