Growth and characterization of textured well-faceted ZnO on planar Si(100), planar Si(111), and textured Si(100) substrates for solar cell applications

Growth and characterization of textured well-faceted ZnO on planar Si(100), planar Si(111), and textured Si(100) substrates for solar cell applications

In this work, textured, well-faceted ZnO materials grown on planar Si(100), planar Si(111), and textured Si(100) substrates by low-pressure chemical vapor deposition (LPCVD) were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and cathode lumin...

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Bibliographic Details
Main Authors: Chin-Yi Tsai, Jyong-Di Lai, Shih-Wei Feng, Chien-Jung Huang, Chien-Hsun Chen, Fann-Wei Yang, Hsiang-Chen Wang, Li-Wei Tu
Format: Article
Language:English
Published: Beilstein-Institut 2017-09-01
Series:Beilstein Journal of Nanotechnology
Subjects:
atomic force microscopy
cathode luminescence
scanning electron microscopy
silicon solar cells
transparent conducting oxide
X-ray diffraction
ZnO
Online Access:https://doi.org/10.3762/bjnano.8.194

Internet

https://doi.org/10.3762/bjnano.8.194

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