Low Side Gan Fet Driver for Space Applications
This paper reports the results of preliminary single event effects (SEE) testing of the Intersil ISL70040SEH, a single low side driver specifically designed to drive enhancement mode power GaN FETs.
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2017-01-01
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| Series: | E3S Web of Conferences |
| Online Access: | https://doi.org/10.1051/e3sconf/20171612006 |